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BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

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Phidix Motion Controls (Shanghai) Co., Ltd.
City:shanghai
Province/State:shanghai
Country/Region:china
Contact Person:MrJohnny Zhang
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BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

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Brand Name :Phidix
Model Number :M22006
Certification :IATF16949,CE
Place of Origin :China
MOQ :Negotiable
Price :Negotiable
Payment Terms :L/C, D/A, D/P, T/T, Western Union
Supply Ability :10 PCS/Month
Delivery Time :40 Work Days
Packaging Details :1 PC/Wooden Box
Color :White
Customization :OEM, ODM
Packing :1 PC/Carton
Warranty :1 year
Lead-time :40 Work Days
Resolution :3nm
Magnification :300000X
Accelerating Voltage :1~30kV
Signal Detection :Secondary Electron Detector (SED)
Electron Gun :Pre-aligned medium-sized fork-type tungsten filament
Max Sample size :370mm in diameter, 68mm in height
Auto Function :Auto Brightness Contrast, Auto Focus
Vacuum system :Better than 9 X 10-4 Pa under High Vacuum
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Magnification 1X-300000X Scanning Electron Microscope 3nm Resolution with Optional BSE,EDS,EBSD,WDS and CL

M22006 is a cost-effective tungsten filament scanning electron microscope for the observation of nanoscale microstructures. It has a magnification of up to 300,000x and a resolution better than 3nm and is also equipped with a 370mm diameter sample chamber. It is a high-performance scanning electron microscope with ultra-high resolution and excellent image quality. The magnification is continuously adjustable, and clear images with high brightness can be obtained in different fields of view. The depth of field is large and the image is rich in stereo. Equipped with a large sample chamber and low voltage mode greatly expands the range of applications.

Specials:

- Magnification Max 300000X.

- Signal Detection: Secondary Electron Detector (SED).

- Accelerating Voltage: 1~30KV, High image resolution.

- BSE/EDS/EBSD/WDS/CL is optional, for component analysis.

- High Vacuum System.

- Three Axis Automatic (Standard).

Item Specification M22006
Resolution 3nm@30kV(SE)
Magnification 1X~300000X
Accelerating Voltage 1~30kV
Signal Detection Secondary Electron Detector (SED)
Electron Gun Pre-aligned medium-sized fork-type tungsten filament
Auto Function Auto Brightness Contrast, Auto Focus
StageSystem/Movement Control Method: Automatic Valve
Turbomolecular Pump:240 L/S
Mechanical Pump:12 m³/h(50 Hz)
Camera:Optical Navigation,Monitoring in the Sample Chamber
Sample Stage Configuration,Three Axis Automatic (Standard)
X: 0~100mm
Y: 0~100mm
Z: 0~60mm
Max Sample Diameter: 370mm
Max Sample Height: 68mm
Five Axis Automatic (Optional)
X: 0~115mm
Y: 0~115mm
Z: 0~65mm
R: 360°
T: -10°~75°
Max Sample Diameter: 370mm
Max Sample Height: 73mm
Vacuum System Better than 9 X 10-4 Pa under High Vacuum
Optional Detector BSEEDSEBSDWDSCL
Imaging System Image Pixel ≤ 6144 x 4096
Image Format: TIFF, JPG, BMP, PNG
Software Language: Chinese / English
Operating System: Windows
Navigation: Optical Navigation, Gesture Quick Navigation
Special Function: Dynamic Astigmatism
Installation Requirements Space: L≥ 3000 mm, W ≥ 4000 mm, H ≥ 2300 mm
Door Size: W ≥ 900 mm, H ≥ 2000 mm
Temperature: 20 ℃ to 25 ℃
Humidity: ≤ 50%
Noise: ≤ 45dB
Power Supply: AC 220 V (±10 %), 50 Hz, 2 kVA
Ground Wire: Less than 4 Ω
AC Magnetic Field: Less than 100 nT

Note: ● means standard, ○ means optional

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BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

Applications

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

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